doc. no : qw0905- rev. : date : data sheet ligitek electronics co.,ltd. property of ligitek only super bright round type led lamps luys3333/s46 - 2005 luys3333/s46 18 - oct a
?? 0.5 typ 1.5max 25.0min 1.0min 2.54typ - + 8.6 7.6 5.0 5.9 directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. package dimensions ligitek electronics co.,ltd. property of ligitek only luys3333/s46 part no. 1/4 page 30 x 0 x 60 x 50% 75% 25% 0 25% 100% -30 x -60 x 50% 75% 100%
note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. absolute maximum ratings at ta=25 j typical electrical & optical characteristics (ta=25 j ) t opr operating temperature color part no emitted material lens storage temperature soldering temperature tsol tstg part no. i f forward current power dissipation reverse current @5v electrostatic discharge peak forward current duty 1/10@10khz esd ir pd i fp parameter symbol -40 ~ +85 j viewing angle 2 c 1/2 (deg) forward voltage @ ma(v) dominant wave length f dnm spectral halfwidth ??f nm luminous intensity @20ma(mcd) 30 min. 587 15 min. max. typ. 700 1100 max 260 j for 5 sec max (2mm from body) -40 ~ +100 j page 50 ma 2000 10 v g a 120 90 mw ma uys ratings unit ligitek electronics co.,ltd. property of ligitek only luys3333/s46 water clear algainp yellow 1.7 2.6 20 luys3333/s46 2/4
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 0.0 0.5 1.0 1.5 2.0 2.5 3.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 650 uys chip part no. page3/4 luys3333/s46
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. thermal shock test solder resistance test high temperature high humidity test 1.ta=65 j? 5 j 2.rh=90 %~95 % 3.t=240hrs ? 2hrs the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hous. mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. operating life test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) low temperature storage test high temperature storage test the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. test condition test item reliability test: description reference standard ligitek electronics co.,ltd. property of ligitek only luys3333/s46 part no. page 4/4
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